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“Working in conjunction with our patented ZDot pattern generator, the camera enables images of samples to be captured by the instrument at a resolution of 1920 x 1440 pixels, enabling our customers to be able to view features in their samples at a spatial resolution of less than 0.5 microns,” said Ken Lee, VP Special Projects at Zeta Instruments.
Once the Zeta-20 captures a 3D image, a Windows-based software package presents the user with 3D images of the sample, a 2D composite image, and a window in which the results of analyzing the sample using the tools found in the software package can be viewed on screen. Analysis tools in thesoftware allow step height measurements on the sample surface to be made, as well as the difference in average height between two locations on the sample surface. In addition, the software can determine the surface roughness of the sample material.
Optical profilers can be used in applications where the surface properties of materials need to be analyzed, such as the characterization of advancedsemiconductor packaging, high-brightness LEDs, solar panels and microfluidic devices, according to Point Grey. The Zeta-20 optical profiler has been adopted any a number of labs and universities, including NIST, the Fraunhofer Institute, MIT, Yale and Purdue as well as at manufacturing facilities in global semiconductor, LED and solar companies.
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