Reader sets new performance standard

Oct. 17, 2005
In-Sight 1721 wafer reader tracks semiconductor wafers through the manufacturing process. It offers a slimmer package and twice the speed of its predecessors, yet maintains mounting and functional compatibility with them. Advanced image-formation technology and OCR and 2-D matrix and barcode-recognition algorithms enable the In-Sight 1721 to deliver reliable reading performance on SEMI-standard scribes.

In-Sight 1721 wafer reader tracks semiconductor wafers through the manufacturing process. It offers a slimmer package and twice the speed of its predecessors, yet maintains mounting and functional compatibility with them. Advanced image-formation technology and OCR and 2-D matrix and barcode-recognition algorithms enable the In-Sight 1721 to deliver reliable reading performance on SEMI-standard scribes. The reader offers flexible mounting options for easy installation on wafer sorters, ion implanters, probers, and other tools. A graphical user interface simplifies setup, and automatic tuning minimizes operator intervention. Built-in network and serial communications provide connectivity to other process tools and the plant network.
Cognex
Natick, MA, USA
www.cognex.com

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