ON Semiconductor announces 8.6 MPixel CCD image sensor

Sept. 11, 2014
ON Semiconductor’s latest CCD image sensor, which is based on the Truesense Imaging interline transfer CCD platform, is an 8.6 MPixel sensor designed for industrial inspection, intelligent traffic systems, and surveillance applications.  

ON Semiconductor’s latest CCD image sensor, which is based on the Truesense Imaging interline transfer CCD platform, is an 8.6 MPixel sensor designed for industrial inspection, intelligent traffic systems, and surveillance applications. The KAI-08670 progressive scan sensor features a 7.4 µm x 7.4 µm pixel size, and 82 dB linear dynamic range through the use of a unique dual-gain amplifier, and the Truesense Sparse Color Filter Pattern. In addition, the sensor features a flexible readout architecture enables use of one, two, or four outputs for full resolution readout up to 12 fps, while a vertical overflow drain structure suppresses image blooming and enables electronic shuttering for precise exposure control.

To Learn More:

Contact: ON Semiconductor
Headquarters: Phoenix, AZ, USA
Product: KAI-08670 CCD image sensor
Key Features: 8.6 MPixel interline transfer CCD, 7.4 µm x 7.4 µm pixel size, 82 dB linear dynamic range, Truesense Sparse Color Filter Pattern.

What ON Semiconductor says:
View more information on the KAI-08670 CCD image sensor.

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About the Author

James Carroll

Former VSD Editor James Carroll joined the team 2013.  Carroll covered machine vision and imaging from numerous angles, including application stories, industry news, market updates, and new products. In addition to writing and editing articles, Carroll managed the Innovators Awards program and webcasts.

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