CCD image sensor from ON Semiconductor targets scientific imaging applications

Dec. 15, 2015
Featuring a full-frame CCD architecture, the KAF-16200 CCD image sensor from ON Semiconductor is designed for demanding scientific imaging and astrophotography applications.  

Featuring a full-frame CCD architecture, the KAF-16200 CCDimage sensor from ON Semiconductor is designed for demanding scientific imaging and astrophotography applications. The sensor, which is available in monochrome and Bayer color, is a 16.2 MPixel sensor with a 6 µm pixel size that achieves frame rates of 1.23 fps. Each pixel contains anti-blooming protection by means of a lateral overflow drain, thereby preventing image corruption during high light level conditions. Additionally, the sensor utilizes a transparent gate electrode to improve sensitivity compared to the use of a standard front side-illuminated polysilicon electrode.

To Learn More:

Contact:ON Semiconductor
Headquarters: Phoenix, AZ, USA
Product: KAF-16200 CCD image sensor
Key Features: Available in monochrome and Bayer color, 16.2 MPixel CCD sensor with a 6 µm pixel size, frame rates of 1.23 fps, anti-blooming protection.

What ON Semiconductor says:
View more information on the KAF-16200.

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About the Author

James Carroll

Former VSD Editor James Carroll joined the team 2013.  Carroll covered machine vision and imaging from numerous angles, including application stories, industry news, market updates, and new products. In addition to writing and editing articles, Carroll managed the Innovators Awards program and webcasts.

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