FEI introduces three transmission electron microscopy systems

FEI has introduced three fully-integrated and automated transmission electron microscopy (TEM) systems designed for specific application and industry needs.

Sep 5th, 2013
Content Dam Vsd Online Articles 2013 09 Fei   Copy

FEI has introduced three transmission electron microscopy (TEM) systems designed for specific application and industry needs. FEI’s Metrios system provides measurements that semiconductor manufacturers need to develop and control their wafer fabrication processes. The Talos system is built to deliver access to 2D and 3D data and provides configurations for materials research and life sciences research. Lastly, the Titan Themis system was designed for enhanced atomic-scale measurements of material properties. FEI’s TEM systems feature fully integrated and automated operation for a range of applications requiring ultra-high resolution to sub-Ångström levels.

To Learn More:

Contact: FEI
Headquarters
: Hillsboro, OR, USA
Product:
Three new transmission electron microscopy systems
Key Features:
Advanced semiconductor manufacturing metrology (Metrios), high-speed imaging and analysis for materials and life sciences applications (Talos), enhanced atomic-sale measurements of material properties (Titan Themis).

What FEI says:
View more information on FEI’s TEM systems.

View More Products| Locate a vendor or system integrator | Receive e-mail updates

Share new products that you think are particularly interesting or helpful by contacting James Carroll, Senior Web Editor, Vision Systems Design.

Join our LinkedIn group | Like us on Facebook | Follow us on Twitter | Check us out on Google +

More in Non-Factory