Originally broadcast on August 23, 2023. Now available On Demand.
Sponsors: Chroma Technology, First Light Imaging, LUCID Vision Labs and Teledyne DALSA
Duration: 1 Hour
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The specialized sensors and technologies that capture short-wave infrared, or SWIR, non-visible wavelengths have seen continual advances in recent years, contributing to the growth of their implementation in automated inspection applications. In this webinar, we will discuss how SWIR imaging is implemented, the advances in technologies, and specific applications that benefit from SWIR imaging including food inspection and sorting, recycling, security imaging, and general industrial automated inspection.
David Dechow | Engineer and Owner | Machine Vision Source
David Dechow has over 35 years of hands-on engineering and design experience in machine vision technology and systems integration. Mr. Dechow is the 2007 recipient of the AIA Automated Imaging Achievement Award honoring industry leaders for outstanding career contributions in industrial and/or scientific imaging.