From Scanning to Seeing: Empowering The Next Generation of Machine Vision

Design machine vision systems with accurate depth data and fewer artifacts. This white paper examines how iToF sensing, global shutter capture, and on-chip processing can improve depth measurement accuracy and reduce system complexity.
June 29, 2026

See how onsemi’s Hyperlux ID iToF sensors enable more accurate machine vision with precise depth measurement, reduced motion artifacts, ambient light rejection, and integrated on-chip processing. This white paper outlines how Hyperlux ID simplifies system design while improving performance in industrial applications.

Key Takeaways:

  • Improve depth accuracy with high-resolution iToF sensing
  • Reduce motion artifacts with global shutter capture
  • Simplify system architecture with integrated processing
  • Minimize external components and compute requirements
  • Enhance performance in high ambient light environments