SWIR line scan detectors from Xenics to be highlighted at SPIE Photonics West 2018

Jan. 18, 2018
At SPIE Photonics West 2018, Xenics will showcase its XLIN-FC SQ and the XLIN-FC R series of high-speed SWIR line scan detectors.

At SPIE Photonics West 2018, Xenics will showcase its XLIN-FC SQ and the XLIN-FC R series of high-speed SWIR line scandetectors. The XLIN-FC R feature rectangular pixels for spectroscopy applications and the XLIN-FC SQ has square pixels for machine vision. Both detectors operate in low-light conditions via a new read-out integrated circuit developed by Xenics, while offering a high quantum efficiency in the 900 – 1700 nm wavelength range. Additionally, the line scan detectors are available in 512, 1024, or 2048-pixel models and can reach line rates of up to 400 kHz.

SPIE Photonics West 2018 booth number: 2235

To Learn More:

Contact: Xenics
Headquarters: Leuven, Belgium
Product: XLIN-FC SQ and the XLIN-FC R SWIR line scan detectors
Key features: Rectangular or square 12.5 µm pixels, new read-out integrated circuit, the 900 – 1700 nm wavelength range, available in 512, 1024, or 2048 pixel models.

What Xenics says:
View more information on XENICS infrared detectors. (Product link forthcoming.)

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About the Author

James Carroll

Former VSD Editor James Carroll joined the team 2013.  Carroll covered machine vision and imaging from numerous angles, including application stories, industry news, market updates, and new products. In addition to writing and editing articles, Carroll managed the Innovators Awards program and webcasts.

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