Free seminar covers automated inspection

MARCH 28--A free seminar sponsored by Edmund Industrial Optics and National Instruments will help you discover how automated inspection technologies can help you improve product quality, develop a vision system, simplify laboratory automation, and integrate motion control.
March 28, 2003

MARCH 28--A free seminar sponsored by Edmund Industrial Optics and National Instruments (NI) will help you discover how automated inspection technologies can help you improve product quality, develop a vision system, simplify laboratory automation, and integrate motion control. Edmund Industrial Optics will discuss lens and optics fundamentals, lighting techniques, and camera technologies. NI will cover image-acquisition hardware and software, the integration of image acquisition with your hardware, and how to build inspection and image processing applications.

Topics to be discussed include machine-vision fundamentals; lens and optics fundamentals; lighting techniques, and camera technologies.

The seminar will be held in Edison, NJ, on Wednesday, April 9, 2003; in Fort Washington, PA, April 10, 2003; in Plainview, NY, April 23, 2003; and in Albany, NY, April 24, 2003. For reservations, directions, or for more information, go to: www.ni.com/seminars/usa.htm or send e-mail to: [email protected].

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