JUNE 17--Pacific Nanotechnology Inc. (PNI; Santa Clara, CA; www.pacificnanotech.com), manufacturer of high-performance, easy-to-use, affordable atomic force microscopes (AFMs), has added the National Instruments LabVIEW interface to its Nano-R and Nano-I AFMs. Although PNI offers SPMCockpit software for acquiring and analyzing AFM images, sometimes it is desirable to customize the software for specific applications and to facilitate the development of unique methods with the PNI AFM systems. This ability is now possible through the LabVIEW interface.
"Using LabVIEW software, we are able to control all of the functions in the AFM microscope including the optical microscope, AFM Scanner, and x-y sample positioner," said Paul West, vice president of products and chief technical officer of PNI. "Users can now expand and customize their instruments to fit their needs while still keeping the current functionality of the software. This ability allows them to creatively explore the limits of their instruments without being hindered by software. They can also customize the software's abilities to collect and display images in any style they want."
National Instruments LabVIEW is a graphical programming language that has been widely adopted as the standard for data acquisition and instrument control software. A description of the LabVIEW interface can be found at www.pacificnanotech.com/tech/labview.htm.
