SuaKIT 2.0, the latest deep learning software library for machine vision applications, has been released by Sualab. The software—which will be on display the company’s booth at The Vision Show 2018—improves upon SuaKIT v1.0, which introduced automated defect inspection in various manufacturing sectors by applying deep learning algorithms. The four major upgrades of v2.0 include image comparison (analyzes differences between two images), detection mode (detects and classifies numerous objects in one image), visual labeler (recommends areas of defects in a product), and visual debugger (visualizes areas inspection by deep learning algorithms).
The Vision Show 2018: 1112
To Learn More:
Contact:SUALAB
Headquarters: Seoul, South Korea
Product: SuaKIT 2.0 deep learning-based machine vision inspection software
Key Features: Image comparison, detection mode, visual labeler, and visual debugger.
What SUALAB says:
View more information on the software.
View More Products| Locate a vendor or system integrator | Receive e-mail updates
Share new products that you think are particularly interesting or helpful by contacting James Carroll, Senior Web Editor, Vision Systems Design.
Share your vision-related news by contacting James Carroll, Senior Web Editor, Vision Systems Design
To receive news like this in your inbox, click here.
Join our LinkedIn group | Like us on Facebook | Follow us on Twitter
