SuaKIT 2.0, the latest deep learning software library for machine vision applications, has been released by Sualab. The software—which will be on display the company’s booth at The Vision Show 2018—improves upon SuaKIT v1.0, which introduced automated defect inspection in various manufacturing sectors by applying deep learning algorithms. The four major upgrades of v2.0 include image comparison (analyzes differences between two images), detection mode (detects and classifies numerous objects in one image), visual labeler (recommends areas of defects in a product), and visual debugger (visualizes areas inspection by deep learning algorithms).
The Vision Show 2018: 1112
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Headquarters: Seoul, South Korea
Product: SuaKIT 2.0 deep learning-based machine vision inspection software
Key Features: Image comparison, detection mode, visual labeler, and visual debugger.
What SUALAB says:
View more information on the software.
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