Edmund Optics introduces PCX lenses designed for metrology and laser applications

Edmund Optics has announced the release of its TECHSPEC λ/20 PCX lenses, which are ideal for a range of uses that require minimal wavefront distortion, including laser and metrology applications.

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Edmund Optics has announced the release of its TECHSPEC λ/20 PCX lenses, which are ideal for a range of uses that require minimal wavefront distortion, including laser and metrology applications. The lenses feature a precision-fused silica substrate, λ/20 surface accuracy and 20-10 surface quality. These RoHS-compliant lenses have a wavelength range of 0.2 - 2.2 μm and a clear aperture of 24. Each lens is available with a full data package that includes interferogram and measured results for diameter, radius, center thickness and centration. In addition, the lenses are offered uncoated with a 25 mm diameter and focal lengths of 50 mm, 75 mm, 100 mm and 150 mm.

To Learn More:

Contact: Edmund Optics
Headquarters: Barrington, NJ, USA
Product: TECHSPEC λ/20 PCX lenses
Key Features: Precision-fused silica substrate, λ/20 surface accuracy and 20-10 surface quality, 25 mm diameter and focal lengths of 50 mm, 75 mm, 100 mm and 150 mm.

What Edmund Optics says:

View more information on the TECHSPEC λ/20 PCX lenses.

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