SANYO selects Teradyne IP750 as CCD image-sensor test system

DECEMBER 5--Teradyne Inc. Japan Division (Kumamoto, Japan; www.teradyne.com) has announced that SANYO Electric Co. Ltd. Semiconductor Co. has purchased the IP750 Image Sensor Test System to test CCD image-sensor devices installed in cellular phones and digital cameras.

Dec 5th, 2001

DECEMBER 5--Teradyne Inc. Japan Division (Kumamoto, Japan; www.teradyne.com) has announced that SANYO Electric Co. Ltd. Semiconductor Co. has purchased the IP750 Image Sensor Test System to test CCD image-sensor devices installed in cellular phones and digital cameras. SANYO has targeted CCDs with superior sensitivity and image quality over CMOS image sensors. Teradyne's IP750 is the first image sensor test system to adopt a complete parallel architecture, providing multisite testing (multidevice parallel measurement of up to four devices simultaneously). The IP750 uses a high-speed PC-based software processing system for image data processing (instead of dedicated hardware), which determines the throughput of an image-sensor test system. The results are expanded capability with high-speed parallel processing and flexibility.

The IP750, based on the INTEGRA J750 test system, features 100-MHz digital drive and has the latest architecture for the complex testing needs of CCD/CMOS image-sensor devices. The test system reduces test cost with fast, parallel measurement of four devices, and its test capability extends from high-speed CCD devices over 10 million pixels to CMOS image-sensor devices requiring the digitize pixel-capture function. For test development, the system features IG-XL software, the semiconductor ATE industry's first test development suite combining the power and performance of the latest PC technology and Windows NT operating system with the familiarity of standard Windows productivity tools.

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