Fast, in-line instrument tests digital camera lenses
AUGUST 26, 2008--A new ultrafast, automated wavefront analyzer can reliably test micro-lens wafers, at a rate of several seconds per lens, ensuring quality control in micro-optics manufacturing.
AUGUST 26, 2008--Equipping massive numbers of mobile phones with built-in digital cameras has scaled up demand for miniature lenses residing on wafers. A new ultrafast, automatedwavefront analyzer can reliably test such micro-lens wafers, at a rate of several seconds per lens, ensuring quality control in micro-optics manufacturing. Assessment of lens imaging quality is ordinarily carried out by computing the modulation transfer function (MTF). However, this method offers only limited information when testing individual lenses. More detail can be obtained from wavefront measurements that provide a spatially resolved map of the refraction properties of the lens, which can be readily compared with design data.
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