The catalog "Motion and Automation for Test, Measurement and Inspection" is available as a pdf for immediate download directly from the company web site or can be ordered as a print copy. The catalog presents motion capabilities in applications that range from sensor testing, surface profiling, and nondestructive test to semiconductor inspection and metrology. Areas of expertise include systems for factory floors, R&D, and vacuum and cleanroom environments. Custom-engineered products and systems are available to end users, integrators, and high-volume OEMs. The 72-page, illustrated catalog includes examples of real-life motion control challenges and solutions for each.
Pittsburgh, PA, USA
-- Posted by Vision Systems Design
NEW PRODUCT PRESS RELEASE
New Catalog - Motion and Automation for Test, Measurement and Inspection
Semiconductor Inspection and Metrology
Cleanroom and High-Vacuum Systems
Integrated Automation and Data Acquisition
Aerotech motion systems' unmatched precision, accuracy and durability have made us a leader in test, measurement and inspection applications across a wide variety of industries. Our newest catalog, Motion and Automation for Test, Measurement and Inspection, presents our motion capabilities in applications as diverse as sensor testing, surface profiling, nondestructive test and semiconductor inspection and metrology. Our expertise includes systems for factory floor, R&D, vacuum and cleanroom environments.
Aerotech's ability to provide custom-engineered products and systems to end users, integrators and high-volume OEMs is unmatched, and our products deliver quality, performance, flexibility and the highest return on investment. The 72-page, illustrated catalog includes examples of real-life motion control challenges and successful solutions for each.
Applications discussed include single- and multi-axis rate tables/motion simulators, motion simulator software and the advanced controls employed in various sensor testing and calibration activities. The catalog features a section on surface measurement and profiling platforms with particular emphasis on our new SMP system and the challenges of sensor integration, process development and data acquisition. Nondestructive test is covered including X-ray inspection, ultrasonic testing and the associated components necessary for a multi-axis solution. The semiconductor inspection and metrology section focuses on ellipsometry, scanning white light interferometry, thin-film measurement, wafer inspection, atomic force microscope positioning, defect detection and particle scanning, reticle inspection and more. The cleanroom and high vacuum systems section discusses our vast experience in this realm. And finally, we provide an in-depth look at the various integrated automation and data acquisition systems and components available to create a seamless, highly accurate and cost-effective motion system.
The new catalog Motion and Automation for Test, Measurement and Inspection is available as a pdf for immediate download directly from www.aerotech.com, or you may order a printed hard copy.
For further information, please contact Steve McLane at 412-967-6854 (direct), or via e-mail at email@example.com.
The Motion and Automation for Test, Measurement and Inspection brochure is available at: http://www.aerotech.com/litreq.cfm