Metrology system captures 500 million pixels in 3 s

JUNE 29, 2009--NxtGen-Wash, with a metrology technique for washed panel applications, is part of the new NxtGen family of inspection and metrology systems.

JUNE 29, 2009--NxtGen-Wash, with a metrology technique for washed panel applications, is part of the new NxtGen family of inspection and metrology systems. Darkfield optics detect defects smaller than the optical pixel. The technique achieves high throughput rates and large depth of field. Detection includes float glass defects, edge chips/cracks and broken corners/flairs, TCO coating defects, and washer residue. It has the ability to measure panel warp/thickness or concentrator profile +/-15 µm. More than 500 million pixels are captured and analyzed in 3 s.
Dark Field Technologies
Orange, CT, USA
www.darkfield.com

-- Posted by Carrie Meadows, Vision Systems Design, www.vision-systems.com

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PRESS RELEASE

Dark Field Technologies Announces New Technology for Inspection of Washed Glass, TCO, Washer Residue and Integrated Panel Warp Metrology, NxtGen-Wash

Dark Field Technologies has drawn on its two decades in the glass industry to develop a new metrology technique for washed panel applications. NxtGen-Wash is a part of the new NxtGen family of inspection and metrology systems. NxtGen-Wash embodies a host of unique benefits and performs all these functions 100% on-line, real-time.

- Special dark field optics detect defects much smaller than the optical pixel. High throughput rates and large depth of field are also achieved
- Detection of float glass defects
- Detection of edge chips/cracks and broken corners/flairs
- Detection of TCO coating defects and washer residue. Both types of defects are normally invisible to the eye, but cause downstream coating defects and reduced panel efficiency
- Panel width, length and squareness measurement
- Integrated panel thickness and warp measurement. Ability to measure panel warp/thickness or concentrator profile +/-15 microns
- Automatic panel rejection if the panel falls outside of prescribed length, width, squareness, defect levels or warp specifications
- Low capital cost; greatest value system available (performance: cost)
- High-speed: over 500 million pixels are captured and analyzed in 3 seconds
- System supports laser, camera or laser: camera optics and divergent, telecentric and self-aligning optical systems -- the only system in the world architected to support all these optical modules

Dark Field Technologies has led the inspection industry for over thirteen years with innovative and first-of-a-kind laser and camera-based inspection and metrology systems. From retro-reflective laser systems for the float glass industry to high-resolution telecentric laser and camera systems for coated glass, display films, display glass, electronics and semiconductor applications, Dark Field Technologies has been the technology vanguard.


Dark Field Technologies
70 Robinson Blvd.
Orange, CT. 06477
www.darkfield.com

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