SWIR line scan detectors from Xenics to be highlighted at SPIE Photonics West 2018
At SPIE Photonics West 2018, Xenics will showcase its XLIN-FC SQ and the XLIN-FC R series of high-speed SWIR line scan detectors.
At SPIE Photonics West 2018, Xenics will showcase its XLIN-FC SQ and the XLIN-FC R series of high-speed SWIR line scandetectors. The XLIN-FC R feature rectangular pixels for spectroscopy applications and the XLIN-FC SQ has square pixels for machine vision. Both detectors operate in low-light conditions via a new read-out integrated circuit developed by Xenics, while offering a high quantum efficiency in the 900 – 1700 nm wavelength range. Additionally, the line scan detectors are available in 512, 1024, or 2048-pixel models and can reach line rates of up to 400 kHz.
SPIE Photonics West 2018 booth number: 2235
To Learn More:
Headquarters: Leuven, Belgium
Product: XLIN-FC SQ and the XLIN-FC R SWIR line scan detectors
Key features: Rectangular or square 12.5 µm pixels, new read-out integrated circuit, the 900 – 1700 nm wavelength range, available in 512, 1024, or 2048 pixel models.