JULY 17--PPT Vision Inc. (Minneapolis, MN; www.pptvision.com) has introduced the PPT861-SH, a high-speed, automated 3- and 2-D inspection system providing precise measurement of a broad range of critical parameters for devices in strip format. Utilizing the patented scanning moiré interferometry (SMI) 3-D technology, the PPT861-SH allows 100% production inspection by delivering comprehensive measurement results at speeds many times faster than other available systems.
Introduced this week at the Semicon West trade show in San Jose, CA, the PPT861-SH provides semiconductor-device and contract manufacturers with high throughput and inspection accuracy for grid-array devices in strips. Combining PPT high-speed 2- and 3-D scanning with precise strip-handling and multimagazine input and output capabilities, the PPT861-SH provides a complete solution for automated strip inspection.
SMI collects 3-D data for all balls and substrates on the entire strip in a single scan. This enables coplanarity inspection speeds, accuracy, and robust performance far surpassing traditional laser or camera-based 3-D inspection systems. It also provides a flexible platform for inspecting both grid- and nongrid-array devices.
The system can scan a broad range of strips that vary in width, length, and material. All scanning parameters are easily programmed to allow for the inspection of a variety of component sizes, lead counts, and package types including BGA, CSP, and LGA. Typical measurements include coplanarity, ball height, ball diameter, substrate flatness and true position. A comprehensive, easy-to-use graphical user interface provides straightforward system setup and operation, while the optional SECS/GEM interface allows the system to be seamlessly integrated into the production process.
