JULY 24, 2008--National Instruments (NI; Austin, TX, USA;www.ni.com) expects to attract more than 3,000 engineers, educators, and scientists to NIWeek 2008, the company's 14th annual customer and technology conference. The conference (Aug. 5-7) at the Austin Convention Center includes interactive technical sessions, targeted summits, hands-on workshops and exhibitions on the latest developments for design, control, automation, manufacturing, and test. The conference also features keynote presentations and demonstrations that highlight how engineers and scientists can use NI graphical system design to test, measure and fix inefficient products and processes to improve everyday life.
James Truchard, NI CEO, president, and cofounder, says "At NIWeek 2008, we will explore innovation in green engineering and look at how the graphical system design platform is leading to the more rapid design, prototyping and deployment of more efficient systems for automated test, industrial measurement and control and embedded applications."
NIWeek 2008 features nearly 200 technical sessions including hands-on workshops, case studies and panel discussions from companies and universities. In addition, the conference features technical summits on machine vision, RF and wireless communications, and sound and vibration, as well as the first Robotics Summit.
Additionally, attendees can learn about new technologies and see product demonstrations at the more than 200 booths at the NIWeek 2008 exhibition. They can also see the technology presented during the technical summits at the Vision Neighborhood, and RF and Wireless, Robotics, and Sound and Vibration pavilions.
For more information or to register for NIWeek 2008, visitwwww.ni.com/niweek.
