MAY 4, 2009--National Instruments (Austin, TX, USA; www.ni.com) has announced plans for NIWeek, a graphical system design conference and exhibition that attracts more than 3,000 engineers, educators, and scientists.
NIWeek 2009, the company's 15th annual customer and technology conference, running Aug. 4-6 at the Austin Convention Center in Austin, TX, provides three full days of technical sessions, hands-on workshops, targeted summits, and interactive exhibitions on the latest developments for design, control, automation, manufacturing, and test.
"NIWeek is a one-of-a-kind opportunity for engineers and scientists to explore the latest technologies for design, control, and test; exchange ideas with colleagues from around the world; and develop new skills that will make their companies more competitive, which is especially important in these challenging times," says James Truchard, NI CEO, president, and cofounder. "At NIWeek 2009, we will look at how the versatility of the graphical system design platform gives engineers and scientists a cost-effective way to make dramatic improvements to their applications."
NIWeek 2009 features more than 200 technical sessions from companies and universities such as Averna, Harris Corp., Freescale Semiconductor, and Purdue University. The sessions will highlight developments in test and data acquisition, industrial measurements and control, embedded design and software development techniques, as well as equip engineers and scientists with the skills they need to remain competitive in development and business practices.
In addition, the conference offers the first ever NIWeek Military and Aerospace Summit along with technical summits on RF and wireless communications, vision, and robotics.
The event also will provide daily keynote presentations from NI executives and R&D staff including Truchard; Jeff Kodosky, NI cofounder and business and technology fellow; Mike Santori, NI business and technology fellow; John Graff, NI vice president of marketing; and Ray Almgren, vice president of academic relations. In addition, Olin College's David Barrett, who has 25 years of robotics experience, will deliver a keynote presentation on how robotics in industry and engineering education is poised to revolutionize the way people interact with technology in their daily lives. Each of the technical summits also will feature keynote presentations from industry experts including Ellen Purdy, enterprise director of joint ground robotics for the U.S. Department of Defense; and Dean Kamen, founder of FIRST (For Inspiration and Recognition of Science and Technology).
Attendees can learn about new technologies and view product demonstrations at more than 200 booths at the exhibition. The exhibition hall features the technologies discussed during the keynote presentations and technical summits in areas such as the LabVIEW Zone and the RF and Wireless Pavilion. The conference also hosts networking events such as daily Peer2Peer Roundtables, which provide opportunities for attendees to discuss best practices with their peers and NI developers for a specific application, job position, or industry.
In addition to the technical sessions, attendees can participate in two-day advanced training sessions offered prior to NIWeek at the Austin Convention Center from Aug. 2-3. The sessions disseminate product knowledge and best practices for NI LabVIEW and RF applications, among others. With each course, attendees can earn 1.4 continuing education units to maintain a professional status such as Professional Engineer. Attendees also can take certification exams in LabVIEW, NI LabWindows/CVI and NI TestStand software.
Learn more about NIWeek 2009, register, or sign up to exhibit at www.ni.com/niweek.
-- Posted by Carrie Meadows, Vision Systems Design, www.vision-systems.com
