Nikon integrates industrial metrology and semiconductor inspection

April 4, 2005
APRIL 4--Nikon Instruments Inc. (Melville, NY; www.nikonusa.com) has announced the integration of two high-precision industrial metrology business units, Semiconductor Inspection and Nexiv Vision Measuring Systems, under the SITECH Division located in Tempe, AZ.

APRIL 4--Nikon Instruments Inc. (Melville, NY;www.nikonusa.com) has announced the integration of two high-precision industrial metrology business units, Semiconductor Inspection and Nexiv Vision Measuring Systems, under the SITECH Division located in Tempe, AZ. The purpose of this move is to improve customer responsiveness by building on the synergies of these high-tech teams and by coordinating their applications engineering and service departments, product management and sales teams, to improve efficiency, and to prepare Nikon for significant new business opportunities in its precision measurement and inspection product roadmap.

The new SITECH Division will be lead by Takeshi Kamiya, general manager, who reports to Lee Shuett, executive vice president, Nikon Instruments. Shuett reports to Fumitaka Akeda, president, Nikon Instruments. "This important change will enable these two businesses to share the facilities at our Tempe office, and by combining our resources, personnel and facilities, position Nikon for broader growth within the semiconductor and vision systems measuring vertical business." said Shuett.

Two new departments have been established within the SITECH Division: Vision Systems Department and Semiconductor Inspection Department. These departments will increase Nikon metrology applications integration across a broad set of industrial market segments including semiconductor, automotive, defense, medical device and electronic components. Michael Metzger, general manager, Industrial Department, will be responsible for marketing for Vision/Measuring Systems and Semiconductor Inspection, as well as Industrial Microscopy, and will remain in Melville, NY.

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