phoenix|x-ray Systems + Services Inc. receives multiple order

SEPTEMBER 26--phoenix|x-ray Systems + Services Inc. (Camarillo, CA; www.phoenix-xray.com), a supplier of microfocus and nanofocus x-ray inspection systems, has received an order for five OVHM4 inspection systems from a leading US-based semiconductor manufacturer.

SEPTEMBER 26--phoenix|x-ray Systems + Services Inc. (Camarillo, CA; www.phoenix-xray.com), a supplier of microfocus and nanofocus x-ray inspection systems, has received an order for five OVHM4 inspection systems from a leading US-based semiconductor manufacturer. The systems will be delivered before year's end and will be used for advanced inspection of semiconductor packages.

The OVHM4, launched earlier this year, is a dual-detector module combining a conventional image intensifier and contrast-sensitive image detector. The tool is based on oblique-view-at-highest-magnification technology and is capable of generating multiple-angle real-time x-ray images of the same sample with both detectors offering an infinitely adjustable penetration angle. This allows the operator to quickly detect failures in interconnects and quantify failures, such as excessive voiding, all in one system.

As a result of this and sales related to other advanced technologies launched in the last 12 months, phoenix|x-ray has seen its order intake double from 2001. In 2001, phoenix|x-ray launched the phoenix|sentry, a fully automated ball-grid-array (BGA) inspection system with wetting analysis, and the Nanofocus analyzer series, a system capable of achieving a focal spot of less than 1 μm. phoenix|x-ray offer a full array of advanced x-ray inspection systems, shipping more than 350 units since launching the company mid-1999.

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