National Instruments to host ninth annual NIWeek Technology Conference

APRIL 25--National Instruments (Austin, TX; www.ni.com) is planning for its ninth annual customer and technology conference. The NIWeek worldwide virtual instrumentation conference kicks off Aug. 13, 2003, at the Austin Convention Center for three days of interactive technical sessions, hands-on training, exhibitions, and workshops on the latest products and technologies for control design, measurement, automation, manufacturing, and test.

The NIWeek 2003 guest keynote speaker is Brian Muirhead, former project manager of the Mars Pathfinder mission and current chief engineer of the Mars Science Laboratory. Muirhead will share his knowledge, experiences, and vision of the roles of software and hardware technology in space exploration. He also will discuss applications of NI products in some of his group's most challenging missions.

NIWeek 2003 features more than 140 unique technical sessions from NI developers and other industry experts. This year, the conference features technical presentations from companies such as Microsoft, NASA, and Texas Instruments that highlight unique approaches to solving measurement and automation applications using virtual instrumentation.

This year, NI will showcase three pavilions on the NIWeek expo floor. The LabVIEW Design Pavilion will feature NI LabVIEW integrated with common design tools for DSP, analog, RF, and embedded control. In the Sensors Pavilion, sensor vendors will display smart transducer electronic data sheets (TEDS) and virtual TEDS sensors along with NI TEDS-capable LabVIEW software and data acquisition products. The Analog and Digital Test Pavilion will highlight new manufacturing test applications, including functional test and device characterization.