• Microspectrophotometer enables automated UV-visible-NIR spectroscopy

    CRAIC Technologies’ 20/30 Perfect Vision UV-visible-NIR microspectrophotometer features a spectral range of 200 to 2100 nm and is suitable for use in semiconductor film thickness measurement, MEMS devices, forensic science, drug chemistry, and process impurity detection.
    Aug. 5, 2013

    CRAIC Technologies’ 20/30 Perfect Vision UV-visible-NIR microspectrophotometer is designed to be fully programmable with touchscreen controls so it can automatically analyze microscopic samples. It features a spectral range of 200 to 2100 nm, integrated TE cooled array detectors, precision temperature control of samples, and specialized software modules that include statistical analysis, spectra mapping, spectral databasing, and image analysis. Potential applications for the 20/30 Perfect Vision microspectrophotometer include semiconductor film thickness measurement, MEMS devices, forensic science, drug chemistry, and process impurity detection.

    To Learn More:

    Contact:CRAIC Technologies
    Headquarters
    : San Dimas, Calif., United States
    Product:
    20/30 Perfect Vision UV-visible-NIR microspectrophotometer
    Key Features:
    Spectral range of 200 to 2100nm, manual or fully automated operation, fully programmable features, touchscreen control.

    What CRAIC says:
    View more information on the20/30 Perfect Vision UV-visible-NIR microspectrophotometer.

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    About the Author

    James Carroll

    Former VSD Editor James Carroll joined the team 2013.  Carroll covered machine vision and imaging from numerous angles, including application stories, industry news, market updates, and new products. In addition to writing and editing articles, Carroll managed the Innovators Awards program and webcasts.

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