JULY 17--GenRad (Westford, MA;www.GenRad.com) will introduce the GR X-Station L Series, its new series of manual x-ray inspection systems, at the electronics-manufacturing industry's SEMICON-West trade show this week in San Jose, CA. Using an advanced manipulator design that allows rapid, accurate sample positioning through wide compound angles, the GR X-Station 130L and 160L systems set a new industry standard for ultrahigh-resolution small-component and circuit-board inspection.
Said Ron Lindell, vice president of GenRad's Process Solutions business unit, "Our advanced technologies ensure accurate failure analysis that is essential to manufacturing increasingly complex, compact, and dense printed-circuit assemblies characteristic of today's emerging products. These breakthrough systems will allow our customers to easily inspect their smallest and most detailed assemblies and to take full advantage of technological advances in developing even more complex PCBs."
To achieve this level of performance, GenRad's new L-Series systems use a high-resolution x-ray source with 3-5-μm focal spots and 2-in./4-in. image intensifiers. The new systems use an advanced imaging processor and an extensive AIP software library. They also add the Constant Magnification Factor feature that maintains measurement integrity. Each of the new inspection systems delivers fast, smooth, and repeatable inspections, while the AIP image-analysis software provides all the necessary tools to immediately identify and analyze process defects.
GenRad's new L-Series systems are currently in full production and are available for delivery to GenRad customers.
