FLIR announces InSb thermal imaging camera for research and scientific applications

FLIR Systems’ X6580sc thermal imaging camera features a 640 x 512 digital InSb detector with broadband (1.5 – 5.5 µm) spectral sensitivity, and is suitable for use in research and development and scientific imaging applications.

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FLIR Systems’ X6580sc thermal imaging camera features a 640 x 512 digital InSb detector with broadband (1.5 – 5.5 µm) spectral sensitivity and F/3 aperture. The X6580sc provides images up to 350 Hz in full frame and up to 4500 Hz in a 320 x 8 sub-windowing mode. The camera connects to FLIR’s ResearchIR Max 3 R&D software to enable thermal imaging data acquisition, analysis, and reporting capabilities. It can be calibrated up to 300°C or up to 3000°C with spectral and/or neutral density filters and features a measurement accuracy of +/-1°C for standard configurations. X6580sc cameras are suitable for use in research and development and scientific imaging applications.

To Learn More:

Contact:FLIR
Headquarters: Wilsonville, OR, USA
Product:
X6580sc thermal imaging camera
Key Features: 640 x 512 digital InSb detector with broadband (1.5 – 5.5 µm) spectral sensitivity and F/3 aperture, 350 Hz in full frame and up to 4500 Hz in a 320 x 8 sub-windowing mode.

What FLIR says:
View more information on FLIR X6000sc cameras.

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