CEDIP Infrared Systems delivers new SATIR multispectral infrared analysis system

Dec. 17, 2002
DECEMBER 17--CEDIP Infrared Systems (Croissy-Beaubourg, France; www.cedip-infrared.com), designer and manufacturer of a full range of infrared systems dedicated to infrared analysis and temperature-measurement applications, has announced the availability of the SATIR system.

DECEMBER 17--CEDIP Infrared Systems (Croissy-Beaubourg, France;www.cedip-infrared.com), designer and manufacturer of a full range of infrared systems dedicated to infrared analysis and temperature-measurement applications, has announced the availability of the SATIR system. It will be used for collecting the infrared signature of aircraft, helicopters, and missiles in the three main IR wavelengths 1--2.5 μm, 3--5 μm and 8--12 μm. The advanced three-camera design of the SATIR allows operators to collect and store in real time sequences of images from each infrared band for later processing.

Each of the three cameras is equipped with a 600-mm lens, thus providing a very narrow field of view of less than a degree. The SATIR system uses the popular JADE cameras as the main sensor together with a real time image processing and storage workstation.

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