Auto focus uses collimated laser source beam

MARCH 18, 2009--The FocusTrac laser auto focus provides real-time focus for nearly all infinite conjugate microscope systems, including those manufactured by Olympus, Leica, Nikon, Zeiss, and Mitutoyo.

MARCH 18, 2009--The FocusTrac laser auto focus provides real-time focus for nearly all infinite conjugate microscope systems, including those manufactured by Olympus, Leica, Nikon, Zeiss, and Mitutoyo. It can be configured to work with many older finite conjugate microscope systems as well as individual telecentric optics. The design is based upon a modified optical version of the "mean transfer function" commonly used in CD/DVD players. The system introduces a collimated laser source beam into the optical path of a microscope system via a custom-designed dichroic narrowband beam splitter, which is highly reflective of the laser source at an incident angle of 45 degrees and highly transmissive to other visible and IR wavelengths.
Motion X
Santa Barbara, CA, USA
www.motionx.org

-- Posted by Carrie Meadows, Vision Systems Design, www.vision-systems.com

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PRESS RELEASE

Motion X Corporation- FocusTrac

The Motion X FocusTrac laser auto focus provides real time focus for most all infinite conjugate microscope systems including those manufactured by Olympus, Leica, Nikon, Zeiss, and Mitutoyo and it can be configured to work with many older finite conjugate microscope systems as well as individual telecentric optics. The FocusTrac design is based upon a modified optical version of the "mean transfer function" commonly used in CD/DVD players. By applying advanced optics, mechanics and electronics the FocusTrac is able to differentiate between "in-focus," "above focus" and "below focus" conditions to produce a relative error signal that can be used to drive the position of the microscope and objectives relative to the sample of interest into an "in focus" condition.

While simple in concept the system is unique to each application it has been applied. Such products include Semiconductors Wafers and Devices, Hard Disk Read Write Heads and Disks, Razor Blades, Photovoltaic Substrates, MEMs Devices, Flat Panel Displays and a number of other inspection and vision based applications. The results of using the FocusTrac are a substantial increase in through put and reduced processing time for a given automated inspection system or in the case of a manual inspection system it provides both a substantial increase in through put as well as greatly reduced operator fatigue. The FocusTrac ensures the sample image remains in focus over the entire inspection area.

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