System measures 3-D surface

SurPhase is a 3-D topography device based on the company's digital phase technology. It is for surface characterization and measurements such as profiles, heights, roughness, and waviness parameters. The device relies on fully digital algorithms. In less than 5 s 3-D topography images of material samples with nanometer resolution can be obtained. SurPhase combines 2-D video microscopy and automated 3-D microtopography. It is a fully certified measurement system providing data according to international standards.
PhaseView USA
San Diego, CA, USA
www.phaseviewusa.com