Device converts microscope into 3-D measurement system

MicroPhase from PhaseView is a 3-D topography device based on patented digital phase technology for surface characterization and 3-D measurements such as profiles, heights, roughness, and waviness parameters. Topography images can be obtained in less than 5 s with nanometer resolution. No alteration of standard microscopy observation modes is needed.

MicroPhase from PhaseView is a 3-D topography device based on patented digital phase technology for surface characterization and 3-D measurements such as profiles, heights, roughness, and waviness parameters. Topography images can be obtained in less than 5 s with nanometer resolution. No alteration of standard microscopy observation modes is needed. It can be used with any transmission or reflection microscope equipped with a video port, without the need for additional optical components or accessories.
Armstrong Optical
Northampton, UK
www.armstrongoptical.co.uk

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