National Instruments' frame grabber acquires up to 850 Mbytes/s

The NI PXIe-1435 Camera Link frame grabber acquires from all Camera Link camera configurations, including 10-tap extended-full, with up to 850 Mbytes/s of throughput.

National Instruments NI PXIe-1435 Camera Link frame grabber
National Instruments NI PXIe-1435 Camera Link frame grabber

The NI PXIe-1435 Camera Link frame grabber acquires from all Camera Link camera configurations, including 10-tap extended-full, with up to 850 Mbytes/s of throughput. Power over Camera Link (PoCL) capability eliminates the need for additional wires in deployment. The PXI Express-compliant board offers 512 Mbytes of DDR2 on-board acquisition memory for transferring large images without data overflow. On-board digital I/O includes four bidirectional transistor-transistor logic (TTL), two opto-isolated inputs, and one quadrature encoder for triggering.
National Instruments
Austin, TX, USA

-- Posted by Vision Systems Design

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National Instruments Introduces Industry’s Highest Throughput PXI Frame Grabber

New Module Ideal for End-of-Line Test and Industrial Inspections Requiring High Data Throughput

National Instruments today announced the NI PXIe-1435 high-performance Camera Link frame grabber. Engineers can use the new module to integrate high-speed and high-resolution imaging into their PXI systems, the industry standard for automated test with more than 1,500 measurement modules available from more than 70 vendors. By combining high-throughput imaging with the benefits of off-the-shelf PXI measurement hardware, NI now offers full software-defined solutions for demanding automated test applications in industries such as consumer electronics, automotive and semiconductor.

The NI PXIe-1435 is the industry’s highest throughput PXI frame grabber and acquires from all Camera Link camera configurations, including 10-tap extended-full, with up to 850 MB/s of throughput. Engineers can power cameras through Power over Camera Link (PoCL)-enabled cables, eliminating the need for additional wires in deployment environments. The frame grabber also offers 512 MB of DDR2 onboard acquisition memory for added reliability in transferring large images without fear of data overflow. Onboard digital I/O includes four bidirectional transistor-transistor logic (TTL), two opto-isolated inputs and one quadrature encoder for triggering and communicating inspection results with automation devices.

The frame grabber incorporates the synchronization, timing, data streaming and processing capabilities of the PXI Express specification, and supports image processing on complementary field-programmable gate array (FPGA) boards to further boost system performance.

“The NI PXIe-1435 frame grabber further complements our capabilities in the PXI platform,” said Matt Friedman, National Instruments senior product manager for the PXI platform and PXISA board member. “The addition of high-performance imaging to our PXI offerings enhances our mixed-signal capabilities for high-end test systems.”

The high throughput and low latency of the Camera Link standard make the frame grabber ideal for line-scan image sensors, which engineers can use for surface inspection of large areas, including finding esthetic and functional defects in solar panels and dead pixels in flat panel displays. The NI PXIe-1435 frame grabber also works well in many industrial applications, such as fault analysis using a stop trigger to record images before and after an event on the factory floor, and medical device applications such as analyzing intricacies in movement and recording stimulus response in objects from heart valves to eye corneas.

Engineers can program the new module using NI LabVIEW graphical development software and the NI Vision Development Module, a comprehensive library of imaging functions. They also can configure it using NI Vision Builder for Automated Inspection software, an easy-to-use, stand-alone package for fast development and simple maintenance. NI vision software helps engineers take advantage of hundreds of imaging processing algorithms, make decisions based on multiple inspection results, customize user interfaces and communicate results using I/O and industrial communication protocols.

SOURCE: National Instruments

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