For the 21st year in a row, National Instruments will hold its NIWeek global graphical system design conference, which is expected to bring together more than 3,200 engineers and scientists across various industries, including imaging and machine vision professionals, manufacturing engineers, machine builders, researchers, quality control engineers, and academic professionals.
From August 3-6 at the Austin Convention Center in Austin, Texas, attendees will have the opportunity to choose from more than 220 interactive technical sessions, case study presentations, and panel discussions for beginners and advanced developers to learn how to optimize efficiency in test and data acquisition systems; understand how to implement advanced technology for industrial design, measurement, and control; and discover emerging trends in science and industry.
NI Week will also feature four four technical tracks that will enable attendees to learn the latest toolsand techniques in both lecture-style and hands-on sessions. Track topics include automated test systems, data acquisition systems, embedded systems, and software development techniques. NI will also hold two special events/workshops on "Building your own embedded systems," and a "trend watch series," which will cover the tools and technologies related to the Internet of Things.
Attendees will also have the opportunity to browse an exhibition of nearly 150 companies, including the following NI Product Showcase and Pavilions:
- LabVIEW Zone
- Automated Test Pavilion
- Data Acquisition Pavilion
- Embedded Control and Monitoring Pavilion
- Academic Pavilion
- Aerospace and Defense Pavilion
- Cyber-Physical Systems Pavilion
- RF and Wireless Pavilion
- Vision Pavilion
- LabVIEW Tools Network Pavilion
- Services and Training Booth
Check out our coverage of some of the exhibiting companies below:
Vision Summit
Once again in 2015, National Instruments will host the two-day Vision Summit, which consists of interactive technical sessions and workshops. Attendees will be able to learn about new products and industry best practices while networking with peers, vendors, integrators, and other vision experts. Technical sessions covered at the Vision Summit are as follows:
- How to Use NI Vision in Practice
- Plasma Measurements Using NI Vision and NI RFSA for Wafer Fabrication
- What's New in the Vision Development Module 2015
- How NI's Vision Tools Helped Solve Two Challenging Applications
- Using the EMVA 1288 Standard to Select the Right Camera
- Machine Vision Optics: Current Trends and the Latest Technology
- NI Vision Plus Industrial Robotics: Easily Solving Typical Robotics Tasks
- Microbiology in Motion: High-Speed 3D Video With a Lattice Light-Sheet Microscope Built Using LabVIEW and FPGA
- Scalable, Flexible, and Distributed Instrumentation for Process Control and Centralized Analytics
- Embedded Vision Platforms
In addition to the Vision Summit, NI will hold the following industry-focused summits that will provide attendees an opportunity to learn more about the latest trends and techniques from keynotes, product technical training, and demonstrations by NI developers and industry-leading researchers.
View more information on NIWeek 2015.
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James Carroll
Former VSD Editor James Carroll joined the team 2013. Carroll covered machine vision and imaging from numerous angles, including application stories, industry news, market updates, and new products. In addition to writing and editing articles, Carroll managed the Innovators Awards program and webcasts.