Latest CCD and CMOS image sensors from ON Semiconductor to be demonstrated at SPIE DCS 2018

March 23, 2018
At SPIE DCS 2018 from April 15-19 in Orlando, ON Semiconductor will showcase its new KAI-43140 CCD image sensor, as well as its new X-Class CMOS image sensor platform.

At SPIE DCS 2018 from April 15-19 in Orlando, ON Semiconductor will showcase its new KAI-43140 CCD image sensor, as well as its new X-Class CMOS image sensorplatform.

The KAI-43140 is a 43 MPixel interline transfer CCD image sensor with a 4.5 µm pixel size and true electronic shutter that supports full resolution frame rates up to 4 fps through the use of flexible 1, 2, or 4 output readout architecture.

ON Semiconductor’s new X-Class image sensor platform, at the time this was written, consists of the XGS12000, a 12.6 MPixel global shutter CMOS image sensor that supports up to 90 fps readout at full resolution, as well as the XGS8000, an 8.8 MPixel global shutter CMOS image sensor that supports up to 120 fps readout at full resolution. These sensors allow one camera design to support not only multiple resolutions but also different pixel designs with only minor modifications, simplifying and speeding time to market for new camera designs, according to ON Semiconductor.

SPIE DCS 2018 booth number: 1430

To Learn More:

Contact: ON Semiconductor
Headquarters: Phoenix, AZ, USA
Products: 43 MPixelKAI-43140 interline transfer CCD image sensor and X-Class CMOS image sensors (12.6 MPixel XGS12000 and 8.8 MPixel XGS8000).

What ON Semiconductor says:
View more information on theKAI-43140.
View more information on the XGS12000.
View more information on the XGS8000.

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James Carroll

Former VSD Editor James Carroll joined the team 2013.  Carroll covered machine vision and imaging from numerous angles, including application stories, industry news, market updates, and new products. In addition to writing and editing articles, Carroll managed the Innovators Awards program and webcasts.

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