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    • Test and Measurement Equipment

    Featured Companies

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    Infrared Lenses

    Avantier Inc

    Is an unparalleled leader in providing custom optical systems solutions. We offer advance precision custom optical design, optical engineering, optical lens assembly, rapid optical...

    Featured Content

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    Lens Test Equipment

    Advancements in Non-Destructive Testing: OCT – Part 3

    Avantier Inc
    Introduction:Non-destructive testing (NDT) plays a crucial role in various industries, enabling the evaluation and analysis of materials and structures without causing any damage...
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    Lens Test Equipment

    CNC Machining

    Avantier Inc
    Avantier offers a wide range of materials, cutting-edge equipment, and optic and component capabilities for custom or OEM optics and components. With over 50 years of expertise...
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    Lens Test Equipment

    Optical Metrology at Avantier Agilent Cary 7000 Spectrophotometer

    Avantier Inc
    At Avantier, we take immense pride in providing comprehensive and reliable metrology services that are meticulously designed to uphold the highest standards of accuracy across...
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    Lens Test Equipment

    Optical Metrology at Avantier TriOptics OptiCentric 100 Dual

    Avantier Inc
    At Avantier, we take pride in offering comprehensive and reliable metrology services, meticulously designed to ensure precise and accurate measurements across various industries...
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    Lens Test Equipment

    Objective Lens Resolution Testing

    Avantier Inc
    At Avantier, our engineering team is dedicated to tailoring solutions for your specific needs and elevating your existing systems. As experts in optical design, we bring extensive...
    Dfm Case Study
    Lens Test Equipment

    Case Study: Objective Lens Design

    Avantier Inc
    Design for Manufacturing (DFM) Case Study: Objective Lens Design for Trapping and Imaging Single AtomsAt Avantier we offer Design for Manufacturing (DFM services), optimizing ...
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    Lens Test Equipment

    Zygo Verifire Interferometer

    Avantier Inc
    At Avantier, we specialize in the design and production of cutting-edge optical solutions and high-performance optics for a diverse range of applications in optical metrology ...
    2022 Dscc Arvr Display Forum
    Display Test Equipment

    Radiant Vision Systems Sponsors and Speaks at the DSCC’s Virtual AR/VR Display Forum

    Radiant Vision Systems
    REDMOND, Wash. – September 7, 2022 – Radiant Vision Systems, a leading provider of test and measurement solutions for displays and light sources, announces that it will sponsor...
    Sidvid2022 Edge Lit Sunroof Inspection 1200
    Display Test Equipment

    Radiant Exhibits and Presents Smart Glass Measurement Solutions for Emerging Sunroof Technologies at Vehicle Displays & Interfaces

    Radiant Vision Systems
    REDMOND, Wash. – August 17, 2022 – Radiant Vision Systems, a leading provider of test and measurement solutions for automotive displays, announces that it will exhibit and lead...
    Membership Micro Led Industry Association Dark Logo2
    Display Test Equipment

    Radiant Vision Systems Joins the MicroLED Industry Association to Support Technology Development

    Radiant Vision Systems
    REDMOND, Wash. – August 2, 2022 – Radiant Vision Systems, a leading provider of scientific imaging systems for automated visual inspection of light sources and displays, announces...
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    Display Test Equipment

    XRE Lens

    Radiant Vision Systems
    Near-Eye Display Test Solution with Electronic Focus

    Latest Content

    A strong partnership between Averna and PI will develop innovative automation solutions for high-quality product manufacturing.: Sander Slagter, Sr. Technical Sales at PI Benelux, Niels Davidts, Vice President of Europe at Averna and Laurent Melin, Director of Sales EMEA at PI(left to right) Image source: Averna & PI.
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    Best Managed Logo Canada
    I3c Ex Pd I3c Protocol Exerciser And Analyzer
    Rpp
    The camera-based measurement solution with the LumiTop 4000 in combination with a 100 mm macro lens permits fast parallel analysis of the μLEDs of a wafer.